–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors: Naoya Yoshimura (Osaka University, Japan); Jaime Morales (Osaka University, Japan); Takuya Maekawa (Osaka University, Japan); Takahiro Hara (Osaka University, Japan)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors: Manoj Kumar Lenka (Indian Institute of Technology Madras, India); Ayon Chakraborty (Indian Institute of Technology, Madras, India)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors: Mustafa Fuad Rifet Ibrahim (Hamburg University of Applied Sciences & Hamburg University of Technology & NXP Semiconductors, Germany); Tunc Alkanat (NXP Semiconductors, The Netherlands); Maurice Meijer (NXP Semiconductors, The Netherlands); Alexander Schlaefer (Hamburg University of Technology, Germany); Peer Stelldinger (Hamburg University of Applied Sciences, Germany)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors: Sara Lazzaro (University Mediterranea of Reggio Calabria, Italy); Vincenzo De Angelis (University of Calabria, Italy); Anna Maria Mandalari (University College London, United Kingdom (Great Britain)); Francesco Buccafurri (University Mediterranea of Reggio Calabria, Italy)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”, “Result Certified”<\/p>\n\n\n\n
Authors: Jun Ma (Telecom SudParis, France); Dimitrije Panic (Telecom SudParis, France); Roberto Yus (University of Maryland, Baltimore County, USA); Georgios Bouloukakis (Telecom SudParis, France)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”, “Result Certified”<\/p>\n\n\n\n
Authors: Alexander Hoelzemann (University of Siegen, Germany); Marius Bock (University of Siegen, Germany); Kristof Van Laerhoven (University of Siegen, Germany)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors: Christine Bassem (Wellesley College, USA); Catherine Grevet Delcourt (Wellesley College, USA); Sofia M Kobayashi (Wellesley College, USA); Yuehe Mao (Wellesley College, USA)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”<\/p>\n\n\n\n
Authors Philipp Kindt (TU Chemnitz, Germany); Cristian Turetta (University of Verona, Italy); Florenc Demrozi (University of Stavanger, Norway); Alejandro Masrur (TU Chemnitz, Germany); Graziano Pravadelli (University of Verona, Italy); Samarjit Chakraborty (University of North Carolina at Chapel Hill (UNC), USA)<\/p>\n\n\n\n
–> accepted: “Artifact Certified”, “Result Certified”<\/p>\n\n\n\n
Authors: Anton Semjonov (Univerist\u00e4t Hamburg, Germany); Gabriele Russo Russo (University of Rome Tor Vergata, Italy); Heiko Bornholdt (Universit\u00e4t Hamburg, Germany); Janick Edinger (University of Hamburg, Germany)<\/p>\n","protected":false},"excerpt":{"rendered":"
Artifact: OpenPack: A Large-scale Dataset for Recognizing Packaging Works in Logistic Environments –> accepted: “Artifact Certified” Authors: Naoya Yoshimura (Osaka University, Japan); Jaime Morales (Osaka University, Japan); Takuya Maekawa (Osaka University, Japan); Takahiro Hara (Osaka University, Japan) Artifact: On-Device Deep Learning for IoT-based Wireless Sensing Applications –> accepted: “Artifact Certified” Authors: Manoj Kumar Lenka (Indian […]<\/p>\n